000			01892 a2200397 4500
001			2901483054
005			20250317100405.0
008			250312042004xx eng
020			_a9782901483052
037			_bTaylor & Francis _cGBP 89.99 _fBB
040			_a01
041			_aeng
072	7		_aTQ _2thema
072	7		_aTHR _2thema
072	7		_aPHJ _2thema
072	7		_aPSA _2thema
072	7		_aPHFC _2thema
072	7		_aPDN _2thema
072	7		_aTQ _2bic
072	7		_aTHR _2bic
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072	7		_aPDND _2bic
072	7		_aSCI047000 _2bisac
072	7		_aTEC019000 _2bisac
072	7		_aSCI077000 _2bisac
072	7		_aSCI055000 _2bisac
072	7		_a548.83 _2bisac
100	1		_aJean- Paul Morniroli
245	1	0	_aLarge-Angle Convergent-Beam Electron Diffraction Applications to Crystal Defects
250			_a1
260			_bCRC Press _c20041101
300			_a450 p
520			_bA publication of the French Society of Microscopies, Large-Angle Convergent-Beam Electron Diffraction Applications to Crystal Defects is devoted to an important aspect of electron diffraction. Convergent-beam diffraction is capable of furnishing remarkably accurate crystallographic information. In this book, the author goes well beyond a simple presentation of the method. The description of convergent-beam electron diffraction and especially of LACBED is preceded by several preparatory chapters, in which the principles of diffraction and the nature of electron-matter interactions are clearly set out. An entire chapter is concerned with instrumentation. Another on the interpretation of diffraction patterns enables the reader to master all stages in the process. The book ends with a long chapter in which numerous applications concerned with the characterization of crystal defects are examined and analyzed.
999			_c1707 _d1707