Soft Errors (Record no. 7298)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 02456 a2200337 4500 |
| 001 - CONTROL NUMBER | |
| control field | 1351831550 |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20250317111638.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 250312042017xx 220 eng |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9781351831550 |
| 037 ## - SOURCE OF ACQUISITION | |
| Source of stock number/acquisition | Taylor & Francis |
| Terms of availability | GBP 64.99 |
| Form of issue | BB |
| 040 ## - CATALOGING SOURCE | |
| Original cataloging agency | 01 |
| 041 ## - LANGUAGE CODE | |
| Language code of text/sound track or separate title | eng |
| 072 7# - SUBJECT CATEGORY CODE | |
| Subject category code | TQ |
| Source | thema |
| 072 7# - SUBJECT CATEGORY CODE | |
| Subject category code | TJFC |
| Source | thema |
| 072 7# - SUBJECT CATEGORY CODE | |
| Subject category code | THR |
| Source | thema |
| 072 7# - SUBJECT CATEGORY CODE | |
| Subject category code | TQ |
| Source | bic |
| 072 7# - SUBJECT CATEGORY CODE | |
| Subject category code | TJFC |
| Source | bic |
| 072 7# - SUBJECT CATEGORY CODE | |
| Subject category code | THR |
| Source | bic |
| 072 7# - SUBJECT CATEGORY CODE | |
| Subject category code | TEC007000 |
| Source | bisac |
| 072 7# - SUBJECT CATEGORY CODE | |
| Subject category code | TEC008000 |
| Source | bisac |
| 072 7# - SUBJECT CATEGORY CODE | |
| Subject category code | TEC008010 |
| Source | bisac |
| 072 7# - SUBJECT CATEGORY CODE | |
| Subject category code | TEC009070 |
| Source | bisac |
| 072 7# - SUBJECT CATEGORY CODE | |
| Subject category code | 005.43 |
| Source | bisac |
| 100 1# - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Jean-Luc Autran |
| 245 10 - TITLE STATEMENT | |
| Title | Soft Errors |
| Remainder of title | From Particles to Circuits |
| 250 ## - EDITION STATEMENT | |
| Edition statement | 1 |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Name of publisher, distributor, etc. | CRC Press |
| Date of publication, distribution, etc. | 20171219 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | 439 p |
| 520 ## - SUMMARY, ETC. | |
| Expansion of summary note | Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics problems that combine not only nuclear and semiconductor physics, material sciences, circuit design, and chip architecture and operation, but also cosmic-ray physics, natural radioactivity issues, particle detection, and related instrumentation. Soft Errors: From Particles to Circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment—one of the most important primary limits for modern digital electronic reliability. Covering the fundamentals of soft errors as well as engineering considerations and technological aspects, this robust text: Discusses the basics of the natural radiation environment, particle interactions with matter, and soft-error mechanisms Details instrumentation developments in the fields of environment characterization, particle detection, and real-time and accelerated tests Describes the latest computational developments, modeling, and simulation strategies for the soft error-rate estimation in digital circuits Explores trends for future technological nodes and emerging devices Soft Errors: From Particles to Circuits presents the state of the art of this complex subject, providing comprehensive knowledge of the complete chain of the physics of soft errors. The book makes an ideal text for introductory graduate-level courses, offers academic researchers a specialized overview, and serves as a practical guide for semiconductor industry engineers or application engineers. |
| 700 1# - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Daniela Munteanu |
| Relationship | A01 |
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